Parallel beam X-ray optics are optical components with a graded multilayer deposited on a substrate having a parabolic shape in beam direction. These optical devices convert (in one dimension) a divergent incoming beam into a parallel one, or vice-versa an incoming parallel beam into a focusing one.
In order to obtain high efficiency, the d-spacing of the multilayer has to be varied from the front end to the rear end of the optics in correspondence to the aspheric curvature. Either the X-ray source or the detector (or detector slit) may be placed at the optics focal distance, for primary or secondary side applications, respectively.
X-ray Optics

Flat and curved multilayer X-ray optics can be used as monochromators, collimators or focussing optics in X-ray diffraction, X-ray reflectometry, X-ray fluorescence analysis and for synchrotron applications. Several types of multilayer X-ray optics can be designed depending on the customers application.
Parallel Beam X-ray Optics
Spectral lines |
Cr, Co, Cu, Ga, Mo, Ag |
Mean Reflectivity |
R > 70% |
Monochromacy |
Kα1+Kα2 or Kβ |
Divergence |
Δφ < 0.03° |
Mirror length |
L = 40...100 mm |
X-ray source geometry |
line focus |
Parallel beam width b |
dependent on mirror length, geometry and X-ray wavelength |
Typical b values |
1.5 mm (Cu-K, L = 60 mm) |
Geometry |
typical focal length |
Focusing X-ray Optics
Focusing X-ray optics are artificial optical components with a 1-dimensional lattice deposited on a substrate.
These optical devices convert a divergent incoming beam into a focusing one. To obtain high efficiency, the d-spacing of the lattice has to be changed from the front end to the rear end of the optics.
The device needs to have an elliptical figure of curvature to produce a focusing beam. The focus of the X-ray source is located in one of the two focal points of the ellipse.
Spectral lines |
Cr, Co, Cu, Ga, Mo, Ag |
Mean Reflectivity |
R > 70% |
Mirror length |
typical values |
X-ray source geometry |
line focus |
Focal line width b |
dependent on spectral |
Geometry |
customized |
ASTIX-c 2-dim. collimating
Collimating 2-dimensional X-ray optics in a modified Montel geometry (1) for the generation of 2-dimensional high intensity parallel X-ray beams
-
Typical length 60 mm - 150 mm
-
Application with all typical types of X-ray
sources (rotating and fixed anodes, liquid
metal jet and micro focus X-ray tubes) -
Typical parallel beam width:
1 mm² ≤ b² ≤ 5 mm² -
Wavelengths: Cr, Co, Cu, Ga, Mo, Ag...
-
High precision vacuum mirror housing
ASTIX-f 2-dim. focusing
High Flux Optics
- high flux (HF) at sample position
- high integrated pixel intensity
High Resolution Optics
- small spot size at sample position
- high resolution (HR) in the detector plane
Focusing 2-dim. X-ray optics in a modified Montel geometry (1) for the generation of 2-dimensional high intensity focused X-ray beams
- Typical length 60 mm - 150 mm
- Application with all typical types of X-ray sources (rotating and fixed anodes, liquid metal jet and micro focus X-ray tubes)
- Typical spot diameter: <30 µm ... 500 µm
- Convergence: customized
- Wavelengths: Cr, Co, Cu, Ga, Mo, Ag...
- High precision vacuum mirror housing
(1) M. Montel - "The X-Ray Microscope with Catamegonic Roof-Shaped Objective" in: X-ray Microscopy and Microradiography, Vol.5, 1957,pp 177 - 185
Flat Graded X-ray Optics
Flat graded multilayers are artificial optical components with a 1-dimensional lattice deposited on a substrate.
These optical devices monochromize the incoming beam while leaving the divergence unchanged, i. e. they generate a divergent monochromatic beam. To obtain high efficiency, the d-spacing of the lattice has to be changed from the front end to the rear end of the multilayer. A plane figure is required for this type of mirror. The device has a single focal point. Either the X-ray source or the detector (or detector slit) may be placed at the optics focal distance, for primary or secondary side applications, respectively.
Spectral lines |
Cr, Co, Cu, Ga, Mo, Ag |
Mean Reflectivity |
R > 70% |
Monochromacy |
Kα1+Kα2 |
Mirror length |
L = 20 mm ... 80 mm |
X-ray source geometry |
line focus preferred |
Capture angle |
φ=0.20° (L = 20 mm) ... |
Application |
monochromator |
Monochromators and synchrotron mirrors
Monochromators are optical devices with a 1-dimensional multilayer deposited on a substrate. To obtain high efficiency, the d-spacing of the multilayer is constant from the front end to the rear end of the monochromator. A plane figure is required for the monochromator.
Depending on the application either high resolution or high flux multi-layer monochromators can be fabricated.
Download: Synchrotron optics prospectus (pdf)
Download: Tender X-ray optics prospectus (pdf)
Spectral range | <50 eV - 100 keV |
Material systems | optimized on wavelength |
Typical sizes | 500 mm length |
Resolution | 0.25% < ΔE/E < 2% |
Thickness | Δd/d < 0.02% |
Applications | monochromators for laboratory X-ray sources and for synchrotrons, optimized for high reflectivity or tailored resolution polarizers in the soft X-ray range (O-K, Fe-L, Ni-L) |
Broadband Mirrors
Tailored depth-graded multilayers
- Multilayer with large number of different bilayer thicknesses to fulfill Bragg’s law for many photon energies / wavelengths
- Broadband or bandpass reflectors possible
- Energy bandwidths of 20% and more feasible
- Can be optimized for photon energies from EUV up to hard X-rays (80 keV and more)
- Selected bandwidth is maintained even if energy and corresponding incidence angle are changed
- Adaptation of the energy band to the source spectrum possible
- Large photon flux due to the collection of a large portion of the source spectrum e.g. at bending magnets