Upgrades available for Cr Kα, Co Kα, Cu Kα, Mo Kα, Ag Kα radiation
Geometries on customers request
Combination of multilayer X-ray optics among each other or of multilayer X-ray optics with other types of X-ray optics to produce one- and two-dimensional collimated, focussed, compressed or expanded monochromatic X-ray beams. Applications in X-ray diffraction, X-ray reflectometry, X-ray tomography and synchrotron applications.
Upgrades available for Cr Kα, Co Kα, Cu Kα, Mo Kα, Ag Kα radiation
Geometries on customers request
Special features
Superior Kb suppression (I Cu Kα1 : I Cu Kβ1 > 1.000.000 : 1 (θ – 2θ – scan at Si (400) wafer))
Special features
Application:
sub-millimeter X-ray-reflectometry
Ni/C gradient multilayer:
direction of period thickness gradient (X)
perpendicular to beam direction (Y)
spot size of the compressed Cu Kα1,2
2 -X-ray beam (Z x X) 0.3 mm x 0.6 mm
Reflectometry result:
No remarkable peak broadening at high peak intensities
Special features